Rastrovací elektrónový mikroskop (PC-SEM)

Jeol JSM-6490 Bruker XFlash Detektor

Type: Jeol JSM-6490

Jeol JSM-6490 Scanning Electron Microscope (PC-SEM)
Modern, high-resolution digital scanning electron microscope with newly developed electron optics and intuitive graphical user interface (GUI) running on Microsoft Windows XP Professional.

Instrument features include:
- Magnification range: 5x - 300,000x
- Acceleration voltage: 0.3 - 30 kV
- Tungsten filament cathode (LaB6 cathode optional)
- Large fully motorised specimen stage with eccentric tilt, including:
- Graphical navigation on the specimen holder
- Simple specimen navigation via Click-Center-Zoom
- Image-field based navigation with 2 navigators
- Relative coordinate navigation
- Save and recall specimen positions
- Adjustable stage imaging window
- Image field correction during rotation via computer-controlled eccentric rotation
- Image field correction during tilt via computer-controlled eccentric tilt
- Calculation of achievable tilt angle based on sample geometry
- Automatic focus tracking during Z-axis movement of the sample
- Intelligent limit switches for motorised axes
- Specimen stage travel distances:
- X = 125 mm
- Y = 100 mm
- Z = 5 to 80 mm (stepless)
- T = -10°C to +90°C
- R = 360° (continuous)
- Secondary electron detector for high vacuum operation
- Innovative super-conical objective lens guarantees highest image resolution, even at steep tilt angles
- Guaranteed SE-image resolution: 3 nm at 30 kV and 15 nm at 1 kV
- Simultaneous live-image display from multiple detectors
- Powerful image measurement functions
- Movie function for recording dynamic processes
- Versatile specimen chamber with numerous upgrade options: free flanges, e.g. for EDX, WDX, EBSD, cathodoluminescence, etc.
- Low-maintenance and wear-resistant, quiet pumping system consisting of a forepump, vibration-free high-performance diffusion pump, and electromagnetic valve control
- Extensive fail-safes against operator error and external media failure
- Ergonomic, height-adjustable system table

SEM starter kit comprising 2 specimen holders, toolkit, and 6 replacement cathodes

Additional Scanning Electron Microscope Equipment:
- Turbomolecular pump instead of standard diffusion pump (using a turbomolecular pump eliminates the need for cooling water for the SEM)

Further SEM equipment:
- PC for SEM control, incl. TFT monitor

Itsdpfszd Ufasx Ac Njk
ΟΧ200 Bruker Quantax 200 EDX System EXTENDED
- Bruker EDX software will be transferred to the new owner after purchase!
- Nitrogen-free energy dispersive X-ray analysis system including:
- SDD detector with 127 eV or better energy resolution
- Detection of all elements from boron onwards
- Vibration-free, maintenance-free, Peltier-cooled (nitrogen-free)
- Pulse processor
- TFT monitor
- Spectrum measurement and element identification
- Fully automatic, quantitative, standardless element analysis
- Image acquisition
- Ultra-fast qualitative line scan
- Ultra-fast qualitative element mapping
- Data management and archiving system
- Report generation and results output
- Data communication
- Installation and training
- HyperMap
- Multipoint analysis
- Bruker xFlash detector (SDD) with SVE III signal processing unit

Scope of delivery: (see photos)
Condition: used
(Changes and errors in the technical data and information are reserved!)

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