Komponent

unbekannt CTX125 X-RAY System Kontrolleinheit

Rok výroby: 2025, Stav: nový, Röntgenový inspekčný systém pre stredne veľké balenia a vrecká. Vhodný na detekciu cudzích telies z kovu, skla, kameňa, plastu atď. v potravinách alebo nepotravinárskych výrobkoch. - Špecifikácie: šírka dopravníka: 410 mm; presnosť detekcie: Pb od Ø 0,2 mm, Fe od Ø 0,28 mm, SUS od Ø 0,28 mm, nemetalické ako kameň, sklo, od Ø 1,2 mm; röntgenový výkon: 80 kVp, 1,25 mA; rozlíšenie detektora: 0,4 mm; emisie röntgenového žiarenia: Kjdpfx Acjv Nm Ine Honf

Stav: Chybný nosič náhradných dielov (použitý), Oxford Instruments Oxford Instruments X-Strata 960 X-ray Fluorescence Analyzer – For Spare Parts / Defective Item Description: For sale is a used X-ray fluorescence analyzer, model Oxford Instruments X-Strata 960. This unit comes from a decommissioned laboratory and is offered exclusively as a source of spare parts or for repair purposes. No functional test has been conducted – thus, the device is considered defective for the purposes of this sale. Technical Data – Oxford Instruments X-Strata 960 (non-binding): Feature | Description -----|----- Model | X-Strata 960 Manufacturer | Oxford Instruments Analysis Method | X-ray fluorescence analysis (XRF) Applications | Coating thickness measurement, material analysis, precious metal inspection Measurement Geometry | Top-down or bottom-up, depending on configuration X-ray Source | X-ray tube (e.g., rhodium anode), 50–100 W power output Detector | Proportional counter or silicon drift detector (SDD), depending on model Measurement Range | Coating thickness approx. 0.005–50 µm (material-dependent) Spot Size | Approx. 15 μm – 1 mm (depending on collimator) Z-axis | Motorized, up to approx. 230 mm measurement height Sample Chamber (W × D × H) | Approx. 580 × 510 × 230 mm Sample Table | Manual or motorized (200 × 200 mm or larger, depending on equipment) Focusing System | Optical / laser focus, partly automatic Operating System | Integrated industrial PC with Windows-based evaluation software Power Supply | 220–240 V / 50–60 Hz / approx. 500–800 W Device Weight | Approx. 150–200 kg (depending on version) Condition | Used / defective / for parts only Knjdpfehaapfjx Ac Hjf Scope of Delivery: as shown in the pictures – no accessories or software included Important Notes: - Item sold explicitly as defective, with no guarantee of functionality. - Item is offered as a source of spare parts or for technicians. - No guarantee for function, completeness, or technical specifications. - Commercial sale with exclusion of any liability for material defects, according to § 447 BGB (shipment purchase). Included in Delivery: - Oxford Instruments X-Strata 960 - All components visible in the images - No further parts, accessories, or documentation included unless explicitly listed. Shipping & Collection: - Collection possible and preferred in Borken - Shipping available by arrangement (Specifications and details subject to change and errors excepted!) For further questions, we are happy to assist you by phone.

Rok výroby: 2016, Stav: veľmi dobrý (použitý), Automatic X-ray Inspection For the inspection of BGA, QFN, THT, LED, LGA, and other solder joints, both visible and hidden. Other features: Includes offline station and repair station Ksdpfx Acswpuado Hsnf OS: Windows 7 Ultra-high speed line-scan CCD detectors Inspection area: 450 mm × 400 mm Image capture: 2D, 2.5D, 3D (layer images with planar CT) PCB dimensions: 60–450 × 50–400 mm AXI resolution: 6–30 µm / px AOI: Camera field of view: 42 mm × 42 mm Resolution: 21 µm Inspection height: -3 to 7.5 mm Optics: telecentric Transport height: 950 mm +/- 25 mm Interface: SMEMA Automatic width adjustment

Rok výroby: 2016, Stav: pripravené na použitie (použité), A like-new Anritsu X-ray inspection system is available. X-ray output: 100W, maximum detection width: 240mm, maximum detection height: 120mm, detection speed for 2kg to 5kg: 10m-60m/min, detection speed up to 2kg: 60m-90m/min, detection speed for 5kg to 10kg: 10m-40m/min. Housing material: stainless steel. Machine weight: approx. 255kg. Operating hours: less than 50h. The machine shows no signs of wear on the conveyor belt or at the radiation protection curtains. Documentation included. On-site inspection is possible. Kodpfx Aovzr Auec Henf

Stav: použitý, PANalytical X’Pert PRO MPD X-ray Diffractometer (XRD) Excerpt from the Service Report: Device: PANalytical X’Pert PRO MPD Date issued: 07/07/2021 Work performed: - Reinstallation and commissioning of the system - Connection of external supply lines - Warm-up phase - Complete alignment of the goniometer and additional components - Maintenance work, including replacement of defective parts Spare parts used: L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD FAN FOR X-CELERATOR UNIT FAN FILTER FILTER, WATER Motor PW3050 ("Device was not tested at our facility") The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) for structural characterization of crystalline materials—perfectly suited for both pure research and routine applications in industry and academia. Thanks to its modular design, fast detection, and temperature and atmosphere control, it excels in both routine analysis and complex in situ experiments. Key Features: - Multiple measurement geometries available: - Reflection in Bragg-Brentano (θ–2θ) mode - Transmission geometry for powders in capillaries - Optional SAXS (Small-Angle X-ray Scattering) for nanostructure analysis - Radiation source and detectors: - Usually copper anode (Cu-Kα, λ ≈ 1.54 Å) - X’Celerator detector (1D, ultra-fast) for parallel data collection - Modular system with PreFIX technology: - Quick change of optics and sample stages without recalibration - In situ measurements at high temperatures: - Measurements possible up to approx. 1200°C - Controlled atmosphere: air, nitrogen, oxygen (limited for reducing conditions) Typical Applications: Knjdpfxswycatj Ac Hsf - Phase analysis and quantitative Rietveld refinement - Determination of crystallite size, microstrain, residual stress - In situ study of phase transitions, oxidation, crystallization, etc. - SAXS measurements for nanoparticle and pore structure analysis - Wide variety of sample types: powders, thin films, ceramics, pharmaceuticals, catalysts, and more Technical Data (typical) Property & Specification - Angle range (2θ): approx. 0.5° to 150° - Step size: up to 0.002° or finer - Goniometer: Vertical, 0–0, radius approx. 240 mm - Temperature range: room temperature up to approx. 1200 °C - Atmosphere: air, N₂, O₂ (limitation for reducing conditions) - Detectors: X’Celerator (1D), Proportional counter Prevalence & Installations: The X’Pert PRO MPD is used worldwide, e.g. at: - Universities (ETH Zurich, TU Dresden, University of Vienna) - Research institutes (e.g. Max Planck Institutes, ICN2, IS2M) - Industry (e.g. materials development, pharmaceuticals, chemicals) Condition: used Scope of delivery: (see photo) (Technical data subject to change and errors excepted!) For further questions, feel free to contact us by phone.

Stav: dobrý (použitý), Helmut Fischer Fischerscope X-ray fluorescence coating thickness measurement XDL- XYmZ Ksdpew Hbkdsfx Ac Henf