Skenovací elektrónový mikroskop (PC-SEM)

Jeol JSM-6490 Bruker XFlash Detektor

Here we offer you a Jeol scanning electron microscope.

Jeol JSM-6490 Scanning Electron Microscope (PC-SEM)

Modern, high-resolution digital scanning electron microscope
with newly developed electron optics and intuitive graphical user interface (GUI) under Microsoft Windows XP Professional.

Magnification range: 5x to 300,000x
Acceleration voltage: 0.3 – 30 kV
Tungsten filament cathode (LaB6 cathode optional)
Large, fully motorized specimen stage with eucentric tilting, incl.
Graphical navigation on the specimen holder
Easy sample navigation via click-center-zoom
Image-frame-based navigation using 2 navigators
Relative coordinate navigation
Saving and recalling of specimen positions
Adjustable field-of-view selection procedure for the specimen stage
Image field correction during rotation via computer-controlled eucentric rotation
Image field correction during tilting via computer-controlled eucentric tilting
Calculation of possible tilt angle based on specimen geometry
automatic focus tracking when moving the sample in the Z-direction
Intelligent limit switches for the motorized axes

Specimen stage travel:
x = 125 mm
y = 100 mm
z = 5 to 80 mm (stepless)
T = -10°C to +90°C
R = 360° (continuous)
Secondary electron detector for high vacuum operation
Innovative, super-conical objective lens ensures highest image resolution even at large tilt angles
Guaranteed resolution in SE image: 3 nm at 30 kV and 15 nm at 1 kV
Simultaneous live image display of multiple detectors
Easy sample navigation via click-center-zoom
Powerful image measurement functions
Movie function for recording dynamic processes
Versatile specimen chamber with numerous expansion options: free flanges, e.g. for EDX, WDX, EBSD, cathodoluminescence, etc.
Low-maintenance, low-wear, quiet pumping system consisting of forepump, vibration-free high-performance diffusion pump, and electromagnetic valve control
Comprehensive safety features to prevent incorrect operation and failure of external supplies
Ergonomic, height-adjustable system table
SEM starter kit including 2 sample holders, tool kit, and 6 replacement cathodes

Additional equipment

2x MP-43100 (TMP)

Turbomolecular pump instead of the standard diffusion pump
When using a turbomolecular pump, no cooling water is required for SEM operation.

Further equipment:

PC for SEM control, incl. TFT monitor

OX200 Bruker Quantax 200 EDX System EXTENDED

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Nitrogen-free energy dispersive X-ray analysis system, incl.:

SDD detector with 127 eV or better energy resolution
Detection of all elements starting from boron
Vibration-free, maintenance-free. Peltier cooled (nitrogen-free)
Pulse processor
TFT monitor
Spectrum measurement and element identification
Fully automatic, quantitative, standardless element analysis
Image capture
Ultra-fast qualitative line scan
Ultra-fast qualitative element mapping
Data management and archiving system
Report generation and results output
Data communication
Installation and training
HyperMap
Multipoint analysis

Bruker xFlash Detector (SDD) with signal processing unit SVE III

Type: Jeol JSM-6490

Scope of delivery: (see photos)

Condition: used

(Subject to modifications and errors in technical data and specifications!)
Further questions can be answered by phone.

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