Merací systém

Leica EM TXP

The EM TXP is a unique device developed for the precise preparation of a wide range of materials and material composites with locally minimal defects. It is specially designed for sawing, milling, grinding, and polishing demanding, small, and unwieldy samples, where the work process is observed under a stereomicroscope and a final examination in a scanning electron microscope or light microscope can be conducted without interruption of the individual work steps. The EM TXP also offers an excellent solution for pre-preparing materials intended for bevel cross-sectioning with an ion polishing system.

Included accessories:
- 1 unit Stereomicroscope M80 complete
- 1 unit Crosshair plate for M80, 12 mm
- 1 unit Movable objective adapter for M80
- 1 unit Angle adjustment adapter
- 1 unit Diamond saw blade
Gsdjytrwaspfx Aameip
- 1 unit Diamond saw blade
- 1 unit Special mill with 6 mm Ø diamond cutting edge
- 1 unit Special mill with 12 mm Ø diamond cutting edge
- 1 unit Special mill with 8 mm Ø tungsten carbide cutter
- 1 unit Special mill with 12 mm Ø tungsten carbide cutter
- 5 units Arbors
- 3 units Carrier for lapping film
- 1 unit Lapping film 15 µm, SiC, Ø 30 mm
- 1 unit Lapping film 9 µm, SiC, Ø 30 mm
- 1 unit Lapping film 5 µm, SiC, Ø 30 mm
- 3 units Carrier for lapping film
- 1 unit Lapping film 9 µm, diamond (type U)
- 1 unit Lapping film 2 µm, diamond (type U)
- 1 unit Lapping film 0.5 µm, diamond (type U)
- 1 unit Lapping film 0.1 µm, diamond (type LA)
- 3 units Carrier for lapping film
- 1 unit Lapping film 9 µm, aluminum oxide
- 1 unit Lapping film 3 µm, aluminum oxide
- 1 unit Lapping film 1 µm, aluminum oxide
- 1 unit Lapping film 0.3 µm, aluminum oxide
- 1 unit Neoprene cloth for final polishing (8 pcs.)
- 2 units Box for carriers and films
- 1 unit Holder for flat samples 0–4 mm
- 1 unit Flat sample holder 3–8 mm
- 1 unit TXP SEM stub holder
- 1 unit Universal sample holder

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