Röntgenový difraktometer (XRD)PANalytical
X’Pert PRO MPD
Röntgenový difraktometer (XRD)
PANalytical
X’Pert PRO MPD
pevná cena bez DPH
13 500 €
Stav
Použitý
Umiestnenie
Borken 

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Údaje o stroji
Cena a lokalita
pevná cena bez DPH
13 500 €
- Umiestnenie:
- Einsteinstraße 8a, 46325 Borken, Deutschland

Volať
Podrobnosti ponuky
- ID záznamu:
- A19531791
- Referenčné č.:
- 24688
- Naposledy aktualizované:
- dňa 10.07.2025
Popis
PANalytical X’Pert PRO MPD X-ray Diffractometer (XRD)
Excerpt from the Service Report:
Device: PANalytical X’Pert PRO MPD
Date issued: 07/07/2021
Work performed:
- Reinstallation and commissioning of the system
- Connection of external supply lines
- Warm-up phase
- Complete alignment of the goniometer and additional components
- Maintenance work, including replacement of defective parts
Spare parts used:
L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD
FAN FOR X-CELERATOR UNIT FAN
FILTER FILTER, WATER
Motor PW3050
("Device was not tested at our facility")
The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) for structural characterization of crystalline materials—perfectly suited for both pure research and routine applications in industry and academia. Thanks to its modular design, fast detection, and temperature and atmosphere control, it excels in both routine analysis and complex in situ experiments.
Key Features:
- Multiple measurement geometries available:
- Reflection in Bragg-Brentano (θ–2θ) mode
- Transmission geometry for powders in capillaries
- Optional SAXS (Small-Angle X-ray Scattering) for nanostructure analysis
- Radiation source and detectors:
- Usually copper anode (Cu-Kα, λ ≈ 1.54 Å)
- X’Celerator detector (1D, ultra-fast) for parallel data collection
- Modular system with PreFIX technology:
- Quick change of optics and sample stages without recalibration
- In situ measurements at high temperatures:
- Measurements possible up to approx. 1200°C
- Controlled atmosphere: air, nitrogen, oxygen (limited for reducing conditions)
Typical Applications:
- Phase analysis and quantitative Rietveld refinement
- Determination of crystallite size, microstrain, residual stress
- In situ study of phase transitions, oxidation, crystallization, etc.
- SAXS measurements for nanoparticle and pore structure analysis
- Wide variety of sample types: powders, thin films, ceramics, pharmaceuticals, catalysts, and more
Technical Data (typical)
Property & Specification
- Angle range (2θ): approx. 0.5° to 150°
- Step size: up to 0.002° or finer
- Goniometer: Vertical, 0–0, radius approx. 240 mm
- Temperature range: room temperature up to approx. 1200 °C
- Atmosphere: air, N₂, O₂ (limitation for reducing conditions)
- Detectors: X’Celerator (1D), Proportional counter
Prevalence & Installations:
The X’Pert PRO MPD is used worldwide, e.g. at:
- Universities (ETH Zurich, TU Dresden, University of Vienna)
- Research institutes (e.g. Max Planck Institutes, ICN2, IS2M)
- Industry (e.g. materials development, pharmaceuticals, chemicals)
Condition: used
Scope of delivery: (see photo)
Lsdpfjwycatsx Af Rsrg
(Technical data subject to change and errors excepted!)
For further questions, feel free to contact us by phone.
Inzercia bola automaticky preložená a vyskytli sa nejaké chyby prekladu.
Excerpt from the Service Report:
Device: PANalytical X’Pert PRO MPD
Date issued: 07/07/2021
Work performed:
- Reinstallation and commissioning of the system
- Connection of external supply lines
- Warm-up phase
- Complete alignment of the goniometer and additional components
- Maintenance work, including replacement of defective parts
Spare parts used:
L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD
FAN FOR X-CELERATOR UNIT FAN
FILTER FILTER, WATER
Motor PW3050
("Device was not tested at our facility")
The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) for structural characterization of crystalline materials—perfectly suited for both pure research and routine applications in industry and academia. Thanks to its modular design, fast detection, and temperature and atmosphere control, it excels in both routine analysis and complex in situ experiments.
Key Features:
- Multiple measurement geometries available:
- Reflection in Bragg-Brentano (θ–2θ) mode
- Transmission geometry for powders in capillaries
- Optional SAXS (Small-Angle X-ray Scattering) for nanostructure analysis
- Radiation source and detectors:
- Usually copper anode (Cu-Kα, λ ≈ 1.54 Å)
- X’Celerator detector (1D, ultra-fast) for parallel data collection
- Modular system with PreFIX technology:
- Quick change of optics and sample stages without recalibration
- In situ measurements at high temperatures:
- Measurements possible up to approx. 1200°C
- Controlled atmosphere: air, nitrogen, oxygen (limited for reducing conditions)
Typical Applications:
- Phase analysis and quantitative Rietveld refinement
- Determination of crystallite size, microstrain, residual stress
- In situ study of phase transitions, oxidation, crystallization, etc.
- SAXS measurements for nanoparticle and pore structure analysis
- Wide variety of sample types: powders, thin films, ceramics, pharmaceuticals, catalysts, and more
Technical Data (typical)
Property & Specification
- Angle range (2θ): approx. 0.5° to 150°
- Step size: up to 0.002° or finer
- Goniometer: Vertical, 0–0, radius approx. 240 mm
- Temperature range: room temperature up to approx. 1200 °C
- Atmosphere: air, N₂, O₂ (limitation for reducing conditions)
- Detectors: X’Celerator (1D), Proportional counter
Prevalence & Installations:
The X’Pert PRO MPD is used worldwide, e.g. at:
- Universities (ETH Zurich, TU Dresden, University of Vienna)
- Research institutes (e.g. Max Planck Institutes, ICN2, IS2M)
- Industry (e.g. materials development, pharmaceuticals, chemicals)
Condition: used
Scope of delivery: (see photo)
Lsdpfjwycatsx Af Rsrg
(Technical data subject to change and errors excepted!)
For further questions, feel free to contact us by phone.
Inzercia bola automaticky preložená a vyskytli sa nejaké chyby prekladu.
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Poznámka: Zaregistrujte sa zadarmo alebo sa prihláste, aby ste získali všetky informácie.
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